JPH0426342U - - Google Patents

Info

Publication number
JPH0426342U
JPH0426342U JP6671490U JP6671490U JPH0426342U JP H0426342 U JPH0426342 U JP H0426342U JP 6671490 U JP6671490 U JP 6671490U JP 6671490 U JP6671490 U JP 6671490U JP H0426342 U JPH0426342 U JP H0426342U
Authority
JP
Japan
Prior art keywords
sample
sample plate
surrounds
airtight
case
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6671490U
Other languages
English (en)
Japanese (ja)
Other versions
JP2559622Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990066714U priority Critical patent/JP2559622Y2/ja
Publication of JPH0426342U publication Critical patent/JPH0426342U/ja
Application granted granted Critical
Publication of JP2559622Y2 publication Critical patent/JP2559622Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
JP1990066714U 1990-06-22 1990-06-22 試料低温装置 Expired - Fee Related JP2559622Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990066714U JP2559622Y2 (ja) 1990-06-22 1990-06-22 試料低温装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990066714U JP2559622Y2 (ja) 1990-06-22 1990-06-22 試料低温装置

Publications (2)

Publication Number Publication Date
JPH0426342U true JPH0426342U (en]) 1992-03-02
JP2559622Y2 JP2559622Y2 (ja) 1998-01-19

Family

ID=31599657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990066714U Expired - Fee Related JP2559622Y2 (ja) 1990-06-22 1990-06-22 試料低温装置

Country Status (1)

Country Link
JP (1) JP2559622Y2 (en])

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57136149A (en) * 1981-02-18 1982-08-23 Rigaku Denki Kk Device for supporting low temperature sample in x ray diffraction device
JPS58167439U (ja) * 1982-04-30 1983-11-08 株式会社島津製作所 試料導入装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57136149A (en) * 1981-02-18 1982-08-23 Rigaku Denki Kk Device for supporting low temperature sample in x ray diffraction device
JPS58167439U (ja) * 1982-04-30 1983-11-08 株式会社島津製作所 試料導入装置

Also Published As

Publication number Publication date
JP2559622Y2 (ja) 1998-01-19

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Legal Events

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